XRD and UV-Vis Spectroscopic Studies of Lead Tin Sulphide (PbSnS) Thin Films
DOI:
https://doi.org/10.48048/tis.2021.16Keywords:
Thin films, Substrates, Lead tin sulphide, Deposition cycle, Optical propertiesAbstract
The effects of deposition cycles on the structural and optical properties of lead tin sulphide (PbSnS) thin films have been described. Successive ionic layer adsorption and reaction (SILAR) method was used to deposit the ternary material on soda-lime substrates. In the present work, the PbSnS films were grown using lead nitrate, tin chloride dehydrate and thioacetamide solutions as sources of Pb, Sn and S, respectively. XRD measurements revealed that the deposited films were polycrystalline in nature with strong adherent to the substrates. The transmittance was found to be high in the near infrared regions of the electromagnetic radiation and, also increased with deposition cycles. The band gap energy was found to vary from 1.70 to 1.75 eV for 10 and 35 deposition cycles. The study indicates that SILAR is an excellent method in depositing good quality films for device applications.
HIGHLIGHTS
- SILAR is an excellent technique for depositing thin films of lead tin sulphide (PbSnS)
- Deposition cycles influences the XRD and optical properties of PbSnS thin films
- PbSnS thin films are useful for solar cell fabrications
- The band gaps of the PbSnS varies from 1.70 to 1.75 eV with deposition cycles
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