Jagtap, S. M. ., and V. J. . Gond. “Modeling of 7 Nano Meter Fin Field Effect Transistor for Evaluation of Fringe &Amp; Oxide Capacitance”. Trends in Sciences, vol. 19, no. 2, Jan. 2022, p. 2051, doi:10.48048/tis.2022.2051.