Jagtap, S. M. . and Gond, V. J. . (2022) “Modeling of 7 Nano Meter Fin Field Effect Transistor for Evaluation of Fringe & Oxide Capacitance”, Trends in Sciences. Nakhon Si Thammarat, Thailand, 19(2), p. 2051. doi: 10.48048/tis.2022.2051.