NG, K. K. .; SOO, Y. G. . Comparison Study of Time Domain Reflectometry (TDR) Measurement Methods for Detecting Wire Interconnect Related Open-Contact and Short-Contact Failures in Power Semiconductor. Trends in Sciences, Nakhon Si Thammarat, Thailand, v. 19, n. 11, p. 4207, 2022. DOI: 10.48048/tis.2022.4207. Disponível em: https://tis.wu.ac.th/index.php/tis/article/view/4207. Acesso em: 9 apr. 2026.